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Structural, Syntactic, And Statistical Pattern Recognition: Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings Paperback - 2006 - 2006th Edition
by Yeung, Dit-Yan (Editor)/ Kwok, James T. (Editor)/ Fred, Ana (Editor)/ Roli, Fabio (Editor)/ De Ridder, Dick (Editor)
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- Paperback
A$262.69
A$29.24
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Details
- Title Structural, Syntactic, And Statistical Pattern Recognition: Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings
- Author Yeung, Dit-Yan (Editor)/ Kwok, James T. (Editor)/ Fred, Ana (Editor)/ Roli, Fabio (Editor)/ De Ridder, Dick (Editor)
- Binding Paperback
- Edition number 2006th
- Edition 2006
- Condition New
- Pages 939
- Volumes 1
- Language ENG
- Publisher Springer Verlag
- Publication date 2006
- Illustrated Yes
- Features Illustrated, Index, Table of Contents
- Bookseller's Inventory # x-3540372369
- ISBN 9783540372363 / 3540372369
- Weight 2.36 lbs (1.07 kg)
- Dimensions 9.34 x 6.06 x 1.24 in (23.72 x 15.39 x 3.15 cm)
- Category Computers - General Information
- Library of Congress Catalogue Number 2006930416
- Dewey Decimal Code 006.4
- Quantity available 2
About Revaluation Books Devon, United Kingdom
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General bookseller of both fiction and non-fiction.
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