Stock photo: cover may vary
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19 Paperback - 2006 - 2006th Edition
by Dit-Yan Yeung (Editor); James T. Kwok (Editor); Ana Fred (Editor)
Add to wish list
Reader reviews for Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19
Write a review for this book
Important Terms and Guidelines
- Please focus on the book’s content and context. Also, add any personal comments as to how you enjoyed the book. Substantiate your likes and dislikes. You may make comparisons to other books.
- Reviews must be at least 140 characters in length.
- Please do not reveal critical plot elements.
- This is not a help line. Contact customer support if you need help.
Your review must not include:
- Obscenities, discriminatory language, or other insulting language not suitable for public domain
- Advertisements, “spam” content, or references to other products, offers or websites.
- Email addresses, URLs, phone numbers, physical addresses or other contact information.
- Overly critical comments about other reviews or reviewers
- Time-sensitive material (i.e. promotional tours, seminars, lectures, etc.)
- Availability, price, or alternative ordering/shipping information
From the publisher
Details
- Title Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19
- Author Dit-Yan Yeung (Editor); James T. Kwok (Editor); Ana Fred (Editor)
- Binding Paperback
- Edition number 2006th
- Edition 2006
- Pages 939
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date 2006-08-03
- Illustrated Yes
- Features Illustrated, Index, Table of Contents
- ISBN 9783540372363 / 3540372369
- Weight 2.36 lbs (1.07 kg)
- Dimensions 9.34 x 6.06 x 1.24 in (23.72 x 15.39 x 3.15 cm)
- Category Computers - General Information
- Library of Congress Catalogue Number 2006930416
- Dewey Decimal Code 006.4
More Copies for Sale
Stock photo: cover may vary
STRUCTURAL, SYNTACTIC, AND STATISTICAL PATTERN RECOGNITION
by YEUNG, D.-Y.; KWOK, J.T.; FRED, A.; ROLI, F.; DE RIDDER, D.,
- New
- Paperback
- first
- Condition
- New
- Edition
- 1st
- Binding
- Paperback
- ISBN 10 / ISBN 13
- 9783540372363 / 3540372369
- Quantity available
- 1
- Seller
- Item price
-
A$89.04A$29.19 Delivery to USA
Show details
Add to wish list
Item price
A$89.04
A$29.19
Delivery to USA
Stock photo: cover may vary
Structural, Syntactic, and Statistical Pattern Recognition
by ,
- New
- Condition
- New
- ISBN 10 / ISBN 13
- 9783540372363 / 3540372369
- Quantity available
- 5
- Seller
- Item price
-
A$186.54A$5.82 Delivery to USA
Show details
Add to wish list
Item price
A$186.54
A$5.82
Delivery to USA
Stock photo: cover may vary
Structural, Syntactic, and Statistical Pattern Recognition
by ,
- Used
- Condition
- New
- ISBN 10 / ISBN 13
- 9783540372363 / 3540372369
- Quantity available
- 5
- Seller
- Item price
-
A$186.54A$5.82 Delivery to USA
Show details
Add to wish list
Item price
A$186.54
A$5.82
Delivery to USA
Stock photo: cover may vary
Structural, Syntactic, And Statistical Pattern Recognition: Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings
by Yeung, Dit-Yan (Editor)/ Kwok, James T. (Editor)/ Fred, Ana (Editor)/ Roli, Fabio (Editor)/ De Ridder, Dick (Editor)
- New
- Paperback
- Condition
- New
- Binding
- Paperback
- ISBN 10 / ISBN 13
- 9783540372363 / 3540372369
- Quantity available
- 2
- Seller
- Item price
-
A$262.69A$29.24 Delivery to USA
Show details
Add to wish list
Item price
A$262.69
A$29.24
Delivery to USA
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
- New
- Paperback
- Condition
- New
- Binding
- Paperback
- ISBN 10 / ISBN 13
- 9783540372363 / 3540372369
- Quantity available
- 422
- Seller
- Item price
-
A$286.55A$15.57 Delivery to USA
Show details
Add to wish list
Item price
A$286.55
A$15.57
Delivery to USA
Stock photo: cover may vary
Structural, Syntactic, and Statistical Pattern Recognition
- New
- Condition
- New
- ISBN 10 / ISBN 13
- 9783540372363 / 3540372369
- Quantity available
- 4
- Seller
- Item price
-
A$268.54A$5.82 Delivery to USA
Show details
Add to wish list
Item price
A$268.54
A$5.82
Delivery to USA