Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings Paperback - 2006 - 2006th Edition
by Dit-Yan Yeung (Editor); James T. Kwok (Editor); Ana Fred (Editor)
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- Paperback
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- Title Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
- Author Dit-Yan Yeung (Editor); James T. Kwok (Editor); Ana Fred (Editor)
- Binding Paperback
- Edition number 2006th
- Edition 2006
- Condition New
- Pages 939
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date 2006-08-03
- Illustrated Yes
- Features Illustrated, Index, Table of Contents
- Bookseller's Inventory # ria9783540372363_inp
- ISBN 9783540372363 / 3540372369
- Weight 2.36 lbs (1.07 kg)
- Dimensions 9.34 x 6.06 x 1.24 in (23.72 x 15.39 x 3.15 cm)
- Category Computers - General Information
- Library of Congress Catalogue Number 2006930416
- Dewey Decimal Code 006.4
- Quantity available 422
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