Design-For-Test For Digital Ic's and Embedded Core Systems

by Alfred Crouch

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Design-For-Test For Digital IC's and Embedded Core Systems

by Crouch, Alfred

Condition
New
Edition
First Edition
Published
1999
Binding
Hardcover
ISBN
9780130848277
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1
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Hygiene, Colorado, USA
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This seller has earned a 5 of 5 Stars rating from Biblio customers.
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A$252.87

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Upper Saddle River, N.J.: Prentice Hall, 1999. Comprehensive text introduces the basic concepts of test and design-for-test (DFT), and addresses the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the… Read more about this item
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A$252.87
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Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L

Condition
Used: Good
Published
0000-00-00
Binding
Hardcover
ISBN
9780130848277
Quantity Available
1
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HOUSTON, Texas, USA
Seller rating:
This seller has earned a 3 of 5 Stars rating from Biblio customers.
Item Price
A$16.44

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Prentice Hall, 0000-00-00. hardcover. Used: Good.
Item Price
A$16.44
No image available

Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L

Condition
Used:Good
Published
0000-00-00
Binding
Hardcover
ISBN
9780130848277
Quantity Available
1
Seller
HOUSTON, Texas, USA
Seller rating:
This seller has earned a 3 of 5 Stars rating from Biblio customers.
Item Price
A$209.72

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Description:
Prentice Hall, 0000-00-00. hardcover. Used:Good.
Item Price
A$209.72