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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Hardback - 1998 - 1999th Edition

by Alvin W. Czanderna (Editor); Theodore E. Madey (Editor); Cedric J. Powell (Editor)

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Reader reviews for Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

From the publisher

Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

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  • Title Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
  • Author Alvin W. Czanderna (Editor); Theodore E. Madey (Editor); Cedric J. Powell (Editor)
  • Binding Hardback
  • Edition number 1999th
  • Edition 1999
  • Pages 430
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date 1998-10-31
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • ISBN 9780306458965 / 0306458969
  • Weight 1.79 lbs (0.81 kg)
  • Dimensions 9.21 x 6.14 x 1 in (23.39 x 15.60 x 2.54 cm)
  • Category Technology & Industrial Arts
  • Library of Congress subjects Materials - Effect of radiation on, Surfaces (Technology) - Analysis
  • Library of Congress Catalogue Number 98041250
  • Dewey Decimal Code 620.44

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Plenum Press, 1998. Volume 5. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,850grams, ISBN:9780306458965
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BEAM EFFECTS, SURFACE TOPOGRAPHY, AND DEPTH PROFILING IN SURFACE ANALYSIS - PROCEEDINGS OF THE...
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BEAM EFFECTS, SURFACE TOPOGRAPHY, AND DEPTH PROFILING IN SURFACE ANALYSIS - PROCEEDINGS OF THE 172ND WE-HERAEUS-SEMINAR HELD IN BAD HONNEF, GERMANY, APRIL 7-11, 1997

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Plenum, 2000. 2nd. Hardcover. New/New.
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BEAM EFFECTS, SURFACE TOPOGRAPHY, AND DEPTH PROFILING IN SURFACE ANALYSIS - PROCEEDINGS OF THE...
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BEAM EFFECTS, SURFACE TOPOGRAPHY, AND DEPTH PROFILING IN SURFACE ANALYSIS - PROCEEDINGS OF THE 172ND WE-HERAEUS-SEMINAR HELD IN BAD HONNEF, GERMANY, APRIL 7-11, 1997

by CZANDERNA, A. W.,MADEY, T. E.,POWELL, C. J.,

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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Proceedings of the...
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

by A. W. Czanderna

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Hardcover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by parti
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface...
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization, 5)

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Springer, 1998-10-31. 2002. hardcover. New. 6.14x1.00x9.21. Buy with confidence. Excellent Customer Service & Return policy.
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Beam Effects, Surface Topography, and Depth Profiling In Surface Analysis
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Beam Effects, Surface Topography, and Depth Profiling In Surface Analysis

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Beam Effects, Surface Topography, and Depth Profiling In Surface Analysis
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Beam Effects, Surface Topography, and Depth Profiling In Surface Analysis

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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

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