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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Hardback - 1998 - 1999th Edition
by Alvin W. Czanderna (Editor); Theodore E. Madey (Editor); Cedric J. Powell (Editor)
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Details
- Title Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
- Author Alvin W. Czanderna (Editor); Theodore E. Madey (Editor); Cedric J. Powell (Editor)
- Binding Hardback
- Edition number 1999th
- Edition 1999
- Pages 430
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date 1998-10-31
- Illustrated Yes
- Features Bibliography, Illustrated, Index
- ISBN 9780306458965 / 0306458969
- Weight 1.79 lbs (0.81 kg)
- Dimensions 9.21 x 6.14 x 1 in (23.39 x 15.60 x 2.54 cm)
- Category Technology & Industrial Arts
- Library of Congress subjects Materials - Effect of radiation on, Surfaces (Technology) - Analysis
- Library of Congress Catalogue Number 98041250
- Dewey Decimal Code 620.44
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization) (Volume 5)
by Czanderna, AW (Ed)
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BEAM EFFECTS, SURFACE TOPOGRAPHY, AND DEPTH PROFILING IN SURFACE ANALYSIS - PROCEEDINGS OF THE 172ND WE-HERAEUS-SEMINAR HELD IN BAD HONNEF, GERMANY, APRIL 7-11, 1997
by CZANDERNA, A. W.,MADEY, T. E.,POWELL, C. J.,
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BEAM EFFECTS, SURFACE TOPOGRAPHY, AND DEPTH PROFILING IN SURFACE ANALYSIS - PROCEEDINGS OF THE 172ND WE-HERAEUS-SEMINAR HELD IN BAD HONNEF, GERMANY, APRIL 7-11, 1997
by CZANDERNA, A. W.,MADEY, T. E.,POWELL, C. J.,
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Proceedings of the 172nd WE-Heraeus-Seminar Held in Bad Honnef, Germany, April 7-11, 1997
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Proceedings of the 172nd WE-Heraeus-Seminar Held in Bad Honnef, Germany, April 7-11, 1997
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization, 5)
by Czanderna, Alvin W
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